Diffusion study of multi-organic layers in OLEDs by ToF-SIMS

Chen, WenYin; Ling, YC; Chen, BoJ; Shih, HH; Cheng, CH

HERO ID

3576185

Reference Type

Journal Article

Year

2006

HERO ID 3576185
In Press No
Year 2006
Title Diffusion study of multi-organic layers in OLEDs by ToF-SIMS
Authors Chen, WenYin; Ling, YC; Chen, BoJ; Shih, HH; Cheng, CH
Journal Applied Surface Science
Volume 252
Issue 19
Page Numbers 6594-6596
Abstract A model organic light-emitting diodes (OLEDs) with structure of tris(8-hydroxyquinoline) aluminum (Alq(3))/N,N'-diphenyl-N,N'-bis[1-naphthy-(1,1'-diphenyl)]-4,4'-diamine (N-PB)/indium tin oxide (ITO)-coated glass was fabricated for diffusion study by ToF-SIMS. The results demonstrate that ToF-SIMS is capable of delineating the structure of multi-organic layers in OLEDs and providing specific molecular information to aid deciphering the diffusion phenomena. Upon heat treatment, the solidity or hardness of the device was reduced. Complicated chemical reaction might occur at the NPB/ITO interface and results in the formation of a buffer layer, which terminates the upper diffusion of ions from underlying ITO. (c) 2006 Elsevier B.V. All rights reserved.
Doi 10.1016/j.apsusc.2006.02.228
Wosid WOS:000240609900049
Is Certified Translation No
Dupe Override No
Is Public Yes
Keyword OLEDs; diffusion; interface; heat treatment; ToF-SIMS