Buff/wipe effects on the physicochemical properties of perfluoropolyether nanoscale thin films
Chen, H; Chung, PilS; Jhon, MS
| HERO ID | 3860618 |
|---|---|
| In Press | No |
| Year | 2014 |
| Title | Buff/wipe effects on the physicochemical properties of perfluoropolyether nanoscale thin films |
| Authors | Chen, H; Chung, PilS; Jhon, MS |
| Journal | Journal of Applied Physics |
| Volume | 115 |
| Issue | 17 |
| Abstract | Buff/Wipe (B/W) process is commonly used in disk drive manufacturing to remove the particles and asperities on the lubricated disk surface. In this paper, we investigated how B/W process impacts the physicochemical properties of perfluoropolyethers (PFPE) nano-films through the study of surface energy and bonded ratio. Two-liquid geometric method was used to analyze the surface energy of nonfunctional PFPE, i.e., Z03, and functional PFPE, i.e., Zdol, lubricated media before and after B/W process. It was found that the dispersive surface energy of Z03 films greatly decreased after B/W, which was more significant in the submonolayer regime. In addition, the bonded ratio slightly increased. However, B/W effect on the surface energy and bonded ratio was not detected for Zdol films. It is hypothesized that nonfunctional PFPE behaves liquid-like on the carbon overcoat due to the weak interaction between lubricant and overcoat. External mechanical stress as applied with B/W can change the conformation and increase the surface coverage for nonfunctional PFPE. On the other hand, functional PFPEs behave solid-like due to the strong attraction between lubricant and overcoat; therefore, it is difficult to change the conformation by external stress from B/W process. (C) 2014 AIP Publishing LLC. |
| Doi | 10.1063/1.4865881 |
| Wosid | WOS:000335643700268 |
| Is Certified Translation | No |
| Dupe Override | No |
| Is Public | Yes |